Nanoindentation surface analysis tool and method

Details Nanoindentation surface analysis tool and method Nanoindentation surface analysis tool and method

2006-02-21

2008-11-18

Raevis, Robert R (Department: 2856)

Measuring and testing

Hardness

By penetrator or indentor

Reexamination Certificate

active

07451636

ABSTRACT:
The present invention provides a novel method for determining the mechanical properties of the surfaces of materials including thin films. Generally, the method is comprised of laterally scanning the surface of the film with an array of cantilever tips varying temperature, load and time to obtain a measurement of mechanical properties, such as hardness and glass transition temperature. The method can be used to obtain mechanical properties of films that would otherwise be unobtainable using standard methods.

REFERENCES:
patent: 4858145 (1989-08-01), Inoue et al.
patent: 5193383 (1993-03-01), Burnham et al.
patent: 5866807 (1999-02-01), Elings et al.
patent: 6457349 (2002-10-01), Miyahara et al.
patent: 6668627 (2003-12-01), Lange et al.
patent: 2002/0179833 (2002-12-01), Shirakawabe
patent: 2004/0218302 (2004-11-01), Maat
Baker (2000) Proceedings of the Materials Research Society Symposium Q 649:379.
Hong (1988) Materials Research Society Symposium Proceedings 130:93.
Oesterschulze (1998) Applied Physics A 66:S3.

Affiliated with

Also associated with

Rating

Nanoindentation surface analysis tool and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Nanoindentation surface analysis tool and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nanoindentation surface analysis tool and method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4033989