Measuring and testing – Hardness – By penetrator or indentor
Reexamination Certificate
2008-10-14
2010-12-14
Raevis, Robert R (Department: 2856)
Measuring and testing
Hardness
By penetrator or indentor
Reexamination Certificate
active
07849731
ABSTRACT:
The present invention provides a novel method for determining the mechanical properties of the surfaces of materials including thin films. Generally, the method is comprised of laterally scanning the surface of the film with an array of cantilever tips varying temperature, load and time to obtain a measurement of mechanical properties, such as hardness and glass transition temperature. The method can be used to obtain mechanical properties of films that would otherwise be unobtainable using standard methods.
REFERENCES:
patent: 4858145 (1989-08-01), Inoue et al.
patent: 5193383 (1993-03-01), Burnham et al.
patent: 5866807 (1999-02-01), Elings et al.
patent: 6457349 (2002-10-01), Miyahara et al.
patent: 6668627 (2003-12-01), Lange et al.
patent: 7451636 (2008-11-01), Bradshaw et al.
patent: 2002/0179833 (2002-12-01), Shirakawabe
patent: 2004/0218302 (2004-11-01), Maat
Baker (2000) Proceedings of the Materials Research Society Symposium Q 649:379.
Bradshaw Richard L.
Duerig Urs T.
Gotsmann Bernd W.
International Business Machines - Corporation
Raevis Robert R
Shifrin Dan
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