Nano-tip fabrication by spatially controlled etching

Etching a substrate: processes – Gas phase etching of substrate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C216S067000

Reexamination Certificate

active

07431856

ABSTRACT:
A method of fabricating nano-tips involves placing a precursor nanotip with an apex and shank in a vacuum chamber; optionally applying an electric field to the precursor nanotip to remove oxide and other contaminant species; subsequently admitting an etchant gas to the vacuum chamber to perform field assisted etching by preferential adsorption of the etchant gas on the shank; and gradually reducing the applied electric field to confine the adsorption of the etchant gas to the shank as etching progresses.

REFERENCES:
patent: 5393647 (1995-02-01), Neukermans et al.
patent: 5611942 (1997-03-01), Mitsui et al.
patent: 5965218 (1999-10-01), Bothra et al.
patent: 6570305 (2003-05-01), Urayama et al.
patent: 6583412 (2003-06-01), Williams
patent: 6649431 (2003-11-01), Merkulov et al.
patent: 6972155 (2005-12-01), Gorman et al.
patent: 7109551 (2006-09-01), Sugi et al.
patent: 2002/0112814 (2002-08-01), Hafner et al.
patent: 2003/0066962 (2003-04-01), Kaito et al.
Mono-atomic tips for scanning tunneling microscopy, Hans-Werner Fink, IBM J. Res, Develop, vol. 30, No. 5, Sep. 1996, pp. 460-465.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Nano-tip fabrication by spatially controlled etching does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Nano-tip fabrication by spatially controlled etching, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nano-tip fabrication by spatially controlled etching will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4009101

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.