Nano-scaled gate structure with self-interconnect capabilities

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Junction field effect transistor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S331000, C257S341000, C257S365000, C257S366000, C257S367000, C438S193000, C438S195000, C438S284000

Reexamination Certificate

active

07115921

ABSTRACT:
Gate conductors on an integrated circuit are formed with enlarged upper portions which are utilized to electrically connect the gate conductors with other devices. A semiconductor device comprises a gate conductor with an enlarged upper portion which electrically connects the gate conductor to a local diffusion region. Another semiconductor device comprises two gate conductors with enlarged upper portions which merge to create electrically interconnected gate conductors. Methods for forming the above semiconductor devices are also described and claimed.

REFERENCES:
patent: 4618510 (1986-10-01), Tan
patent: 4975382 (1990-12-01), Takasugi
patent: 5185277 (1993-02-01), Tung et al.
patent: 5300445 (1994-04-01), Oku
patent: 5387529 (1995-02-01), Oku
patent: 5399896 (1995-03-01), Oku
patent: 5538910 (1996-07-01), Oku
patent: 6159781 (2000-12-01), Pan et al.
patent: 6653181 (2003-11-01), Hergenrother et al.
patent: 2003/0119233 (2003-06-01), Koganei
B. Doris et al., “Extreme Scaling with Ultra-Thin Si Channel MOSFETs,” IEEE, 4 pages, 2002.
“New Roadmap Identifies Industry Challenges,” Semiconductor International, 6 pages, 2004.
R. Li et al., “Damascene W/TiN Gate MOSFETs with Improved Performance for 0.1-μm Regime,” IEEE Transactions on Electron Devices, vol. 49, No. 11, pp. 1891-1896, Nov. 2002.
B.J. Ginsberg et al., “Selective Epitaxial Growth of Silicon and Some Potential Applications,” IBM J. Res. Develop., vol. 34, No. 6, Nov. 1990.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Nano-scaled gate structure with self-interconnect capabilities does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Nano-scaled gate structure with self-interconnect capabilities, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nano-scaled gate structure with self-interconnect capabilities will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3656298

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.