Static information storage and retrieval – Floating gate – Particular connection
Patent
1994-03-18
2000-11-21
Tran, Andrew Q.
Static information storage and retrieval
Floating gate
Particular connection
36518502, 365103, 365104, 257314, 257315, G11C 1604
Patent
active
061512494
ABSTRACT:
In an EEPROM including a plurality of NAND memory cells each constituted by connecting memory cells each having a floating gate and a control gate in series with each other, first selection transistors respectively coupled between the same bit line and terminals, on one side, of each pair constituted by two NAND memory cells of the plurality of memory cells, and second selection transistors respectively coupled between terminals on the other side and source lines (SL), the first or second selection transistors are constituted by an enhancement transistor and a depletion transistor which are coupled in series with each other, and the arrangements of the depletion transistor and enhancement transistor of the first selection transistors are reversed to those of the second selection transistors in the same NAND memory cells.
REFERENCES:
patent: 4962481 (1990-10-01), Choi et al.
patent: 4980861 (1990-12-01), Herdt et al.
patent: 5043942 (1991-08-01), Iwata et al.
patent: 5050125 (1991-09-01), Momodomi et al.
patent: 5111428 (1992-05-01), Liang et al.
patent: 5253206 (1993-10-01), Tanaka et al.
"Densely arrayed EEPROM having low-voltage tunnel write", E. Adler, IBM TDB, vol. 27, No. 6, Nov. 1984, pp. 3302-3307.
Momodomi Masaki
Shirota Riichiro
Kabushiki Kaisha Toshiba
Tran Andrew Q.
LandOfFree
NAND-type EEPROM having bit lines and source lines commonly coup does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with NAND-type EEPROM having bit lines and source lines commonly coup, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and NAND-type EEPROM having bit lines and source lines commonly coup will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1264135