Nand gate circuit

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons

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307449, 307443, 307452, 307453, H03K 19017, H03K 19094, H03K 1920, H03K 17687

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active

050598252

ABSTRACT:
A NAND gate circuit which can be used for a decoder circuit, includes a high potential voltage source (V.sub.cc), an output terminal (V.sub.OUT), and a load element (T.sub.1) connected between the high potential electric voltage source (V.sub.cc) and the output terminal (V.sub.OUT). A driving circuit is serially connected with the output terminal (V.sub.OUT), and a low potential voltage source (V.sub.ss), and has a plurality of driving transistors (T.sub.2, T.sub.3) which are serially arranged. An input signal is applied to each gate. At least one transistor, constituting the driving circuit, has a driving performance different from the other transistors of the driving circuit. An ideal NAND gate circuit can be provided in which erroneous operation due to noise can be effectively prevented by setting the input threshold voltage to a constant voltage no matter what the combination of the input signals.

REFERENCES:
patent: 4620116 (1986-10-01), Ozawa
patent: 4649296 (1987-03-01), Shoji
patent: 4730133 (1988-03-01), Yoshida
patent: 4780626 (1988-10-01), Guerin et al.
patent: 4797580 (1989-01-01), Sunter
patent: 4827160 (1989-05-01), Okano
patent: 4851716 (1989-07-01), Needles et al.
Patent abstracts of Japan, vol. 6, No. 144 (E-122)[1022], Aug. 3, 1982 & JP-Aj-57 67 333 (Matsushita Denki Sangyo K.K.), Apr. 23, 1982.
Patent abstracts of Japan, vol. 2, No. 51, Apr. 12, 1978, p. 965 E 78, & JP-A-53 15 055 (Tokyo Shibaura Denki K. K.), 02-10-1978.
IEEE Journal of Solid-State Circuits, vol. SC-19, No. 5, Oct. 1984, pp. 657-663, IEEE, New York, U.S., S. Tanaka et al., "A Subnanosecond 8K-Gate CMOS/SOS Gate Array".

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