Static information storage and retrieval – Floating gate – Particular connection
Reexamination Certificate
2011-06-14
2011-06-14
Tran, Michael T (Department: 2827)
Static information storage and retrieval
Floating gate
Particular connection
C365S185240
Reexamination Certificate
active
07961516
ABSTRACT:
A NAND flash memory comprising blocks which are units of writing and deletion of data, the block comprising: memory cells from which data corresponding to values of held threshold voltages can be read by applying a reading voltage to control gates of the memory cells; source-side selection gate transistors connected between a common source line and the memory cells; drain-side selection gate transistors connected between a bit line and the memory cells; and monitor cells which are configured as the memory cells and have a threshold voltage set according to monitor data, and from which data corresponding to values of held threshold voltages can be read by applying a decision voltage to control gates of the monitor cells.
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Office Action issued Jun. 25, 2010, in Korean Patent Application No. 10-2008-0122939 (with English-language Translation).
Office Action issued on Jan. 20, 2011 in Korean Patent Application No. 10-2008-0122939 (with English Translation) 5 pages.
Kabushiki Kaisha Toshiba
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Tran Michael T
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