NAND flash memory and data programming method thereof

Static information storage and retrieval – Floating gate – Particular connection

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S185060, C365S185120, C365S238500, C365S230080

Reexamination Certificate

active

11833051

ABSTRACT:
A semiconductor integrated circuit device includes even-numbered bit lines, odd-numbered bit lines, cell source lines, first memory elements electrically connected between the even-numbered bit lines and the cell source lines, and second memory elements electrically connected between the odd-numbered bit lines and the cell source lines and belonging to the same rows as the first memory elements. A potential corresponding to data to be programmed is applied to the first memory element via the even-numbered bit line and a potential which suppresses programming is applied to the second memory element via the cell source line while the odd-numbered bit lines are kept in an electrically floating state when data is programmed into the first memory element.

REFERENCES:
patent: 5923587 (1999-07-01), Choi et al.
patent: 6058042 (2000-05-01), Nobukata et al.
patent: 6353242 (2002-03-01), Watanabe et al.
patent: 6704239 (2004-03-01), Cho et al.
patent: 7245528 (2007-07-01), Shibata et al.
patent: 2002/0117756 (2002-08-01), Yamashita
patent: 2005/0259466 (2005-11-01), Kim
patent: 2007/0133287 (2007-06-01), Hosono
patent: 1 349 214 (2003-10-01), None
patent: 8-195393 (1996-07-01), None
patent: 2000-91546 (2000-03-01), None
Ken Takeuchi, et al., “A Source-line Programming Scheme for Low Voltage Operation NAND Flash Memories”, Symposium on VLSI Circuits Digest of Technical Papers, pp. 37-38, Jun. 1999.
Ken Takeuchi, et al., “A Double-Level Vth Select Gate Array Architecture for Multi-Level NAND Flash Memories”, Symposium on VLSI Circuits Digest of Technical Papers, pp. 69-70, Jun. 1995.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

NAND flash memory and data programming method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with NAND flash memory and data programming method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and NAND flash memory and data programming method thereof will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3921084

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.