N2 based plasma treatment for enhanced sidewall smoothing...

Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – Active layer of indirect band gap semiconductor

Reexamination Certificate

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Details

C257S350000, C257S288000, C257S701000, C257SE21170, C257SE21051, C257SE21229, C257SE21311, C257SE21267, C257SE21421

Reexamination Certificate

active

07910936

ABSTRACT:
A method of forming a semiconductor device including forming a low-k dielectric material over a substrate, depositing a liner on a portion of the low-k dielectric material, and exposing the liner to a plasma. The method also includes depositing a layer over the liner.

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