N- well CMOS process on a P substrate with double field guard ri

Metal working – Method of mechanical manufacture – Assembling or joining

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29576B, 29578, 148 15, 357 42, 357 52, H01L 21265, H01L 2176

Patent

active

045744670

ABSTRACT:
CMOS transistors are fabricated in a P substrate using N- well regions. These wells are positioned to prevent aluminum spiking in the N channel devices. After P guard rings are formed for both P and N channel devices, additional masking and implantation are performed to produce N guard rings in the P channel devices. Before the transistors are formed, an implantation of P type impurities is performed causing the P channel devices, when they are formed, to have a PMOS buried channel.

REFERENCES:
patent: 3983620 (1976-10-01), Spadea
patent: 4013484 (1977-03-01), Boleky et al.
patent: 4075754 (1978-02-01), Cook, Jr.
patent: 4135955 (1979-01-01), Gasner et al.
patent: 4277291 (1981-07-01), Cerofolini et al.
patent: 4299024 (1981-11-01), Piotrowski
patent: 4385947 (1983-05-01), Halfacre et al.
patent: 4391650 (1983-07-01), Pfeifer et al.
patent: 4435895 (1984-03-01), Parrillo et al.
patent: 4470191 (1984-09-01), Cottrell et al.
patent: 4474624 (1984-10-01), Matthews
patent: 4480375 (1984-11-01), Cottrell et al.

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