Multistage snapback ESD protection network

Details Multistage snapback ESD protection network Multistage snapback ESD protection network

2007-11-20

2007-11-20

Leja, Ronald W. (Department: 2836)

Electricity: electrical systems and devices

Safety and protection of systems and devices

Load shunting by fault responsive means

Reexamination Certificate

active

10917605

ABSTRACT:
A snapback ESD protection network coupled across first and second integrated circuit pads and including first and second snapback devices, such as SCR devices, with the second device having a turnoff current ITOFFwhich is greater than the turnoff current of the first device. Each of the snapback devices has an anode terminal and a cathode terminal, with the first device anode and cathode terminals being coupled to the respective first and second integrated circuit pads through a first effective series resistance and the second device being coupled to the respective first and second integrated circuit pads through a second effective series resistance, with the first effective series resistance being smaller than the second so as to cause the first and second snapback devices to tend to turn on at about the same time at the beginning of an ESD event. The differences in turnoff current cause the second snapback device to turn off prior to the first snapback device at the conclusion of an ESD event.

REFERENCES:
patent: 5574618 (1996-11-01), Croft
patent: 5880488 (1999-03-01), Yu
patent: 6534834 (2003-03-01), Ashton et al.
patent: 6621126 (2003-09-01), Russ
patent: 6803633 (2004-10-01), Mergens et al.
patent: 6949800 (2005-09-01), Steinhoff
patent: 7064393 (2006-06-01), Mergens et al.
patent: 2004/0021998 (2004-02-01), Salome et al.
Russ, C., Gieser, J., Verhaege, K.; “ESD Protection Elements During HBM Stress Tests—Further Numerical and Experimental Results,” EOS/ESD Symposium, 1994, pp. 96-105, no month.
Verhaege, K., Roussel, P. J., Groesenken, G., Maes, H.E., Gieser, H., Russ, C., Egger, P., Guggenmos, X., Kuper, F. G.; “Analysis of HBM ESD Testers and Specification Using a 4thOrder Lumped Element Model,” EOS/ESD Symposium, 1993, pp. 129-131, no month.
Verhaege, K., Groeseneken, G., Maes, H. E.; “Influence of Tester, Test Method and Device Type on CDM ESD Testing”; EOS/ESD Symposium, 1994, pp. 49-62, no month.
Concannon, A., Vashchenko, V. A., Hopper, P., Beek, M. T., “ESD Protection of Double-Diffusion Devices in Submicron CMOS Processes”, Proc. ESSDERC, 2004, pp. 261-264, no month.

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