Image analysis – Histogram processing – For setting a threshold
Patent
1985-09-20
1988-03-15
Boudreau, Leo H.
Image analysis
Histogram processing
For setting a threshold
382 31, G06K 900
Patent
active
047318597
ABSTRACT:
A pattern recognition system for use with a two-dimensional image, each point associated with a height and with contributions from various wavelengths of light. The image to be analyzed is first sensed by a sensor and stored in a memory. Signals, read from the memory, are filtered and processed to produce signals measuring each of the wavelengths and measuring the height. The resulting distributions of data are first scanned for areas containing appropriate height measurements. Each pixel of these areas is classified according to predetermined classification definitions, further reducing the areas to be processed. These areas are subjected to spatial classification according to other classification definitions. The spatial classification may be accomplished by a neighborhood processor. The areas of the image are then identified with the features to be recognized.
REFERENCES:
patent: 3315229 (1967-04-01), Smithline
patent: 3745527 (1973-07-01), Yoshimura
patent: 4097845 (1978-06-01), Bacus
patent: 4115761 (1978-09-01), Ueda et al.
patent: 4307376 (1981-12-01), Miller et al.
Holter Marvin J.
Larrowe Vernon
Maxwell Robert J.
Zuk David
Boudreau Leo H.
Environmental research Institute of Michigan
LandOfFree
Multispectral/spatial pattern recognition system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Multispectral/spatial pattern recognition system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multispectral/spatial pattern recognition system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1930982