Optics: measuring and testing – By shade or color – With color transmitting filter
Patent
1997-08-07
1999-07-20
Kim, Robert H.
Optics: measuring and testing
By shade or color
With color transmitting filter
356425, 364526, 250226, G01J 351, G01N 2188
Patent
active
059262826
DESCRIPTION:
BRIEF SUMMARY
BACKGROUND OF THE INVENTION
The present invention relates to a multispectral sensor device for analysing optical radiation with unknown spectral composition and intensity distribution predominantly from the ultraviolet region (UV) through the visible region (VIS) up to the near infrared region (NIR).
DESCRIPTION OF THE PRIOR ART
Such a sensor can be employed as a colour recognition system with the prescribed three spectral components red, green and blue in the VIS region, as an extended colour recognition system with the additional spectral components as colour equivalents, or, on increasing the number of channels and thus reducing the spectral bandwidth, also as a channel spectrometer.
In the field of technology, various colour measurement systems or spectral analysers are known.
DE 36 22 043 A1 describes a device for colour measurement. This device requires at least two prescribed spectral sensitivity functions and a number of illuminated filters for spectral filtering, a detector arrangement with a detector behind each filter and an evaluation circuit which receives the detector signals delivered by the detectors and delivers the measurement value signals assigned to the individual sensitivity functions. In a data store of the evaluation circuit a plurality of weighting factors, each of which is assigned to one of the individual sensitivity curves, are stored. The evaluation circuit derives the measurement value signals, each of which is assigned to one of the individual sensitivity curves, from the detector signals of these detectors, these signals being weighted with the weighting factors assigned to the respective sensitivity functions. Only a crude colour determination can be achieved with this arrangement. For spectral analyses with 10 nm resolution per measurement channel, for example, in the visible region (380 nm to 700 nm) 40 channels would be needed, to realize which would require a big outlay with this arrangement.
In DE 41 43 284 A1 an integrated semiconductor sensor for spectrometers is described. This sensor comprises a plurality of radiation detectors, charge storage and charge transport units, supply potential lines, logic circuits and output amplifiers. These units are arranged in a one- or two-dimensional arrangement so as to convert the radiation from subregions of the spectrum into electrical signals. The radiation detectors, which are assigned to one, or several connected, wavelength regions of the spectrum imaged on the integrated semiconductor sensor, all have dimensions matched to the local resolving conditions, which result from the diaphragm and dispersion systems of the spectrometer and the radiation source under investigation, and are arranged in accordance with the line structure of the spectrum. The storage--charge transport--amplifier and circuit units, which are circuited behind the detectors, are equipped in a way which is specific to the sensors being used. By means of such an arrangement together with an integrated logic circuit, the signals of the detectors of selectably connected sections of at least one wavelength region which is covered regularly with detectors are combined singly or partially and are read out serially and/or in parallel. In addition, the light integration time of the individual sections is controlled.
This sensor can also be used as a colour sensor. Its disadvantage, however, lies in the fact that each subregion of the spectrum requires an appropriately matched detector in the measurement channel. This means that either the spectral region to be detected is restricted or that a large number of such detectors must be realized in order to detect the whole spectral region to be detected. For many measurement problems this is not possible, however, since the measurement beam of the incident light must be optically broadened in such a way that all the spectrally matched detectors are illuminated uniformly. As a result, the semiconductor sensor itself becomes large and the light intensity at the individual detectors decreases.
DE 41 33 481 A1 descri
REFERENCES:
patent: 4653014 (1987-03-01), Mikami et al.
patent: 4653925 (1987-03-01), Thornton, Jr.
patent: 5218555 (1993-06-01), Komai et al.
patent: 5526119 (1996-06-01), Bilt et al.
Haase Norbert
Kalz Andreas
Knobloch Jens
Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung
Kim Robert H.
Smith Zandra V.
LandOfFree
Multispectral sensor device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Multispectral sensor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multispectral sensor device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1327006