Multiscale multidimensional well log data inversion and deep...

Details Multiscale multidimensional well log data inversion and deep... Multiscale multidimensional well log data inversion and deep...

2007-06-26

2007-06-26

McElheny, Jr., D. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Earth science

C702S011000, C703S010000

Reexamination Certificate

active

11266537

ABSTRACT:
Different subsets of multiarray resistivity measurements are inverted using a corresponding resistivity model. The models are selected based at least in part on the resolution of the measurements. Results of the inversion are combined to give a single model consistent with the resolution and depth of penetration of each subset of the multiarray data.

REFERENCES:
patent: 4837517 (1989-06-01), Barber
patent: 5157605 (1992-10-01), Chandler et al.
patent: 5452761 (1995-09-01), Beard et al.
patent: 5854991 (1998-12-01), Gupta et al.
patent: 5867806 (1999-02-01), Strickland et al.
patent: 5889729 (1999-03-01), Frenkel et al.
patent: 6060885 (2000-05-01), Tabarovsky et al.
patent: 6502036 (2002-12-01), Zhang et al.
patent: 6944546 (2005-09-01), Xiao et al.
patent: 2002/0017905 (2002-02-01), Conti
patent: 2003/0038634 (2003-02-01), Strack
patent: 2003/0057950 (2003-03-01), Gao et al.
patent: 2004/0117120 (2004-06-01), Frenkel et al.
patent: 2004/0140811 (2004-07-01), Conti
patent: 2004/0145370 (2004-07-01), Conti
patent: 2004/0196046 (2004-10-01), Aidan et al.
patent: 2004/0207403 (2004-10-01), Fanini et al.
patent: 2005/0156602 (2005-07-01), Conti
patent: 2006/0023569 (2006-02-01), Agullo et al.
patent: 2006/0235619 (2006-10-01), Yang et al.
J.W. Smits et al.;Improved Resistivity Interpretation Utilizing a New Array Laterolog Tool and Associated Inversion Processing, SPE 49328, 1998 SPE Annual Tec.hnical Conference and Exhibition, New Orleans, Louisiana, Sep. 27-30, 1998, pp. 831-844, 14 Figs.

Affiliated with

Also associated with

Rating

Multiscale multidimensional well log data inversion and deep... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Multiscale multidimensional well log data inversion and deep..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multiscale multidimensional well log data inversion and deep... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3830167