Image analysis – Pattern recognition – Feature extraction
Patent
1997-06-30
2000-05-16
Boudreau, Leo H.
Image analysis
Pattern recognition
Feature extraction
382190, 382260, 382278, 3647242, 36472803, G06K 946, G06K 966, G06K 15316, G06F 738
Patent
active
06064768&
ABSTRACT:
A detector system locates a feature in an input signal. The input signal is applied to a multiscale filter bank which produces a corresponding set of filtered signals that are applied to a multiscale detector. A scale space tree table is produced by the detector which indicates the location in each filtered signal where the feature is possibly located. A MAP correlator examines the scale space tree table to determine which indications therein are feature locations. One-dimensional and two-dimensional embodiments are described. In addition, the design framework is disclosed for extending a one scale filter to a multiscale filter, for designing a filter bank from the multiscale filter and for designing the MAP correlator dependent on the feature being located and the chosen filter bank.
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Chin Roland T.
Hajj Hazem M.
Nguyen Truong Q.
Boudreau Leo H.
Mariam Daniel G.
Wisconsin Alumni Research Foundation
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