Optics: measuring and testing – Material strain analysis – By light interference detector
Patent
1989-10-06
1991-06-25
Turner, Samuel
Optics: measuring and testing
Material strain analysis
By light interference detector
356354, G01L 124
Patent
active
050261541
ABSTRACT:
An improved dynamic moire interferometer comprised of a lasing medium providing a plurality of beams of coherent light, a multiple q-switch producing multiple trains of 100,000 or more pulses per second, a combining means collimating multiple trains of pulses into substantially a single train and directing beams to specimen gratings affixed to a test material, and a controller, triggering and sequencing the emission of the pulses with the occurrence and recording of a dynamic loading event.
REFERENCES:
patent: 4850693 (1989-07-01), Deason et al.
Diffraction Moire: The Dynamic Regime, Deason et al., SPIE Proceedings, vol. 746, 8-1987.
Albrecht John M.
Cordell Helen S.
Moser William R.
The United States of America as represented by the United States
Turner Samuel
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