Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-03-08
1997-12-02
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
G01R 3102
Patent
active
056940505
ABSTRACT:
The purpose of the test method is to improve test efficiency in a semiconductor test method utilizing multiprobing. The semiconductor test method involves placing probes into contact with the electrode pads of semiconductor chips on a semiconductor wafer with a test head providing and receiving test signals through the probes thereby checking the electrical properties of the semiconductor chips sequentially. According to the test method, in order to test a plurality of adjacent semiconductor chips simultaneously, as many probes are provided as the number of semiconductor chips to be tested simultaneously, the test head is capable of providing and receiving test signals for the plurality of semiconductor chips simultaneously, and the number of semiconductor chips that are tested simultaneously is determined without being limited to a power of 2.
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patent: 4967146 (1990-10-01), Morgan et al.
patent: 5070297 (1991-12-01), Kwon et al.
Nguyen Vinh P.
Tokyo Seimitsu Co. Ltd.
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