Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-05-17
2005-05-17
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S715000, C324S754090
Reexamination Certificate
active
06894513
ABSTRACT:
The present application describes a method and an apparatus for characterizing a conductive plane using multipoint measurement. In an embodiment of the present invention, a known current is injected in the conductive plane using multipoint probes and voltage is measured using multipoint probes. The electrical characteristics of the plane can be determined using the values of the known current, measured voltage and the distance between the probes. In an embodiment of the present invention, the conductive plane is integrated in a semiconductor package of an integrated circuit and the value of the known current is determined based on the actual current that can be provided by the integrated circuit during normal operation.
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patent: 5914611 (1999-06-01), Cheng
patent: 6218846 (2001-04-01), Ludwig et al.
patent: 0 974 845 (2000-01-01), None
Pannala Sreemala
Sen Bidyut
Sun Microsystems Inc.
Zagorin O'Brien Graham LLP
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