Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent
1976-03-24
1978-10-17
Evans, F. L.
Optics: measuring and testing
Inspection of flaws or impurities
Bore inspection
250343, 356184, 356188, 356 51, G01N 2124
Patent
active
041205928
ABSTRACT:
Apparatus for enlarging the analytical capability of a photometric analyzer for segregating a first preselected analytical radiation wavelength band for passage through a first sample cell and segregating a second preselected analytical radiation wavelength band for passage through a second sample cell, after which emergent radiations from both sample cells are directed to a common radiation detector.
REFERENCES:
patent: 2678581 (1954-05-01), Reisner
patent: 3459951 (1969-08-01), Howarth et al.
patent: 3917406 (1975-11-01), Siegler, Jr.
Negus, Instruments & Control Systems, vol. 37, Aug. 1964, pp. 87-96.
Fleming Sydney Winn
Weeks Gregory Paul
E. I. Du Pont de Nemours and Company
Evans F. L.
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