X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1985-07-08
1987-06-23
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 85, G21K 106
Patent
active
046758895
ABSTRACT:
Multiple wavelength X-ray dispersive devices and method of forming them are provided which reflect at least two wavelengths of interest at the same or different angles. The devices include a plurality of layer sets formed on one another, each set having at least two units. At least one unit includes at least two layers having a first d spacing and the second unit has at least one layer with a second d spacing. A plurality of one or both of the units can also be provided in each layer set.
REFERENCES:
patent: 3397312 (1968-08-01), Okano
Underwood and Barbee, Jr., "Layered Synthetic Microstructures as Bragg Diffractors", Applied Optics, vol. 20, No. 17, Sep. 1981, pp. 3027-3034.
Underwood and Attwood, "The Renaissance of X-Ray Optics", Physics Today, Apr. 1984, pp. 44-52.
Grupido Nicola J.
Hart Keith L.
Keem John E.
Wood James L.
Church Craig E.
Goldman Richard M.
Ovonic Synthetic Materials Company Inc.
Porta David P.
Siskind Marvin S.
LandOfFree
Multiple wavelength X-ray dispersive devices and method of makin does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Multiple wavelength X-ray dispersive devices and method of makin, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multiple wavelength X-ray dispersive devices and method of makin will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-726879