Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate
2011-01-11
2011-01-11
Toatley, Gregory J (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
C356S237600
Reexamination Certificate
active
07869021
ABSTRACT:
A system for on-the-fly inspection of components is provided. The system includes a prism structure disposed below an inspection item transit path. An image data system is disposed below the prism structure. A lighting assembly provides a first lighting source to illuminate a plurality of sides of an inspection item and a second lighting source to illuminate a bottom of the inspection item.
REFERENCES:
patent: 4977552 (1990-12-01), Gotoh
patent: 6226092 (2001-05-01), de Lega
patent: 7057718 (2006-06-01), Kwirandt
patent: 2003/0169916 (2003-09-01), Hayashi et al.
patent: 2008/0236306 (2008-10-01), Mater et al.
Amanullah Ajharali
Ge Han Cheng
Lai Hing Tim
Tan Huek Choy
Alli Iyabo S
ASTI Holdings Limited
Jackson Walker L.L.P.
Rourk Christopher J.
Toatley Gregory J
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