Multiple source laser scanning inspection system

Details Multiple source laser scanning inspection system Multiple source laser scanning inspection system

1979-07-27

1981-05-05

Corbin, John K.

Optics: measuring and testing

By monitoring of webs or thread

For flaws or imperfections

250572, G01N 2189

Patent

active

042655455

ABSTRACT:
A laser scanning flaw direction inspection system is provided for simultaneously scanning a plurality of laser sources across a moving web of material being inspected. The plurality of laser beams are simultaneously scanned utilizing a common scanning apparatus. Laser beam radiation from the plurality of laser sources is collected from the web of material being inspected and detected for generating signals based on the integrity of the radiation applied to the detector from the material being inspected. The plurality of laser sources are preferably of different wave lengths, may have different spot sizes and may be separated by a fixed distance in either the scanned direction or in the direction of web travel. By providing such flexibility in size, positioning and wavelength, and using optical filters to separate the signals related to each of the sources, different types of flaws as well as different information may be generated which would not be possible using a single source system.

REFERENCES:
patent: 3510658 (1970-05-01), Rabedeau
patent: 3843890 (1974-10-01), Anthony, Jr. et al.
patent: 3866054 (1975-02-01), Wolf
patent: 3900265 (1975-08-01), Merlen et al.
patent: 3980891 (1976-09-01), Slaker
patent: 3992111 (1976-11-01), Roulier et al.

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