Multiple ratio single particle counter

Optics: measuring and testing – For size of particles – By particle light scattering

Patent

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Details

356343, 250574, G01N 1502

Patent

active

041881214

ABSTRACT:
The present invention is an improved multiple ratio single particle counter. Intensities of scattered radiation are measured at more than two angles and ratios of these intensities are derived. These ratios are compared with calibration curves to determine an unambiguous measure of the particle parameter.

REFERENCES:
patent: 3310680 (1967-03-01), Hasegawa
patent: 3770351 (1973-11-01), Wyatt
patent: 3835315 (1974-09-01), Gravitt, Jr.

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