Multiple, parallel, spatial measurement of electrical phase

Details Multiple, parallel, spatial measurement of electrical phase Multiple, parallel, spatial measurement of electrical phase

1995-06-12

1997-10-28

Turner, Samuel A.

Optics: measuring and testing

By particle light scattering

With photocell detection

324 7637, G01B 902

Patent

active

056822383

ABSTRACT:
A signal processing apparatus for providing accurate electrical phase difference measurement of multiple concurrent signal inputs is disclosed. Phase measurement of an individual signal input is accomplished utilizing an efficient spatial sampling scheme. In operation, measurement and reference wideband RF inputs, differing primarily in phase over frequency, are respectively applied to two RF Channelizer components. Each Channelizer separates the composite input bandwidth into multiple time-coincident frequency output channels. Corresponding pairs of output channels then phase modulate a common independent carrier which propagates to the detection plane of a photodetector array forming a spatial interference pattern along one axis for each frequency channel number. A preferred detector element scaling relative to the interference pattern affords efficient phase difference measurement incorporating three detector elements at each frequency channel. Conversion of the preferred three detector element intensity values to relative signal phase is accomplished with an algorithm.

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Hal L. Levitt et al., Superresolution Precision Direction-Finding Techniques and Measurements, SPIE Aerospace Sensing & Control Symposium, Orlando, Florida, Technical Conference #2489, Apr. 18, 1995, 12 pages.

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