Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2007-06-12
2007-06-12
Ahmed, Samir (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C348S087000, C356S237100
Reexamination Certificate
active
09782626
ABSTRACT:
A system and method of inspecting electrical circuits with multiple optical inputs, including: obtaining first and second image data that are generally spatially coincidental but which each include some image data that is different, modifying one of the images by employing the other image so as to produce an enhanced representation of the electrical circuit, and inspecting the enhanced representation for defects.
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Hakim Saki Itzhak
Smilansky Zeev
Ahmed Samir
Ladas & Parry
Orbotech Ltd.
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