Multiple measurement noise reducing system using artifact edge i

Details Multiple measurement noise reducing system using artifact edge i Multiple measurement noise reducing system using artifact edge i

1983-02-22

1985-02-12

Britton, Howard W.

Facsimile and static presentation processing

Facsimile

Specific signal processing circuitry

358282, 358284, 378 92, 378 99, 364414, 128653, H04N 532, H04N 140

Patent

active

044994931

ABSTRACT:
Disclosed is a multiple measurement multiple energy X-ray imaging system in which a plurality of measurements are processed to provide a first image signal representing a desired parameter of an object and in which the plurality of measurements are processed to provide a second processed image signal having greater signal-to-noise ratio than the first processed image signal but in which extraneous artifacts may be introduced into the signal. The spatial location of edges of the extraneous artifacts are determined. The first processed image signal and the second processed image signal are combined to provide an improved image signal except at the spatial locations of the extraneous artifacts where the first processed image signal is used for the image signal thereby eliminating the extraneous artifact from the displayed image.

REFERENCES:
patent: 4445226 (1984-04-01), Brody
patent: 4463375 (1984-07-01), Macovski

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