Multiple lead voltage probe and method of making same

Details Multiple lead voltage probe and method of making same Multiple lead voltage probe and method of making same

1995-08-23

1997-08-05

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

G01R 3102

Patent

active

056546475

ABSTRACT:
A probe head includes analog amplifier inputs, a ground plane, and hundreds of probe leads between the inputs and the pins of a circuit under test. The customer defines the grounded pins of the circuit under test. Non-active probe leads, i.e. leads corresponding to the grounded pins are connected to the ground plane, maximizing the connections between the grounds of the probe and the circuit under test and minimizing unequal ground potentials. The probe circuit is on a probe circuit board, while the connections between the ground plane and the leads are fusible elements on a separate ground personality board. The probe is placed on a simulated circuit under test, the grounded pins on the circuit under test are protected by an insulating cap, and a voltage is placed on the remainder of the pins to fuse the elements corresponding the active probe leads.

REFERENCES:
patent: 3984166 (1976-10-01), Hutchison
patent: 4891585 (1990-01-01), Janko et al.
patent: 5132613 (1992-07-01), Papae et al.
patent: 5205741 (1993-04-01), Steen et al.
patent: 5244395 (1993-09-01), DeSantis et al.
patent: 5266059 (1993-11-01), Taylor
patent: 5288238 (1994-02-01), Ikenaka et al.

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