Multiple lead analog voltage probe with high signal integrity ov

Details Multiple lead analog voltage probe with high signal integrity ov Multiple lead analog voltage probe with high signal integrity ov

1995-02-03

1997-04-29

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, G01R 3102

Patent

active

056252994

ABSTRACT:
A probe head includes integrated circuit chip inputs, a ground plane on a circuit board, and hundreds of probe leads comprising traces on the circuit board connected between the inputs and a circuit under test. Each trace is about 3 mils wide. There is a DICLAD polytetrafluoroethylene dielectric material of dielectric constant of about 2.2 between the ground and traces. Every other trace is electrically connected to the ground plane. Input resistors are buried in the circuit board and there is an on-chip input divider network. The customer defines the grounded pins of a circuit to be tested. Probe leads corresponding to the grounded pins are connected to the ground plane, maximizing the connections between the grounds of the probe and the circuit under test and minimizing unequal ground potentials.

REFERENCES:
patent: 4342957 (1982-08-01), Russell
patent: 4697143 (1987-09-01), Lockwood et al.
patent: 4853627 (1989-08-01), Gleason et al.
patent: 4894612 (1990-01-01), Drake et al.

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