Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2005-02-22
2008-03-18
Everhart, Caridad (Department: 2891)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C257SE21597, C438S712000, C438S735000
Reexamination Certificate
active
07344994
ABSTRACT:
A process for etching semiconductor substrates using a deep reactive ion etching process to produce through holes or slots (hereinafter “slots”) in the substrates. The process includes applying a first layer to a back side of a substrate as a first etch stop material. The first layer is a relatively soft etch stop material. A second layer is applied to the first layer on the back side of the substrate to provide a composite etch stop layer. The second layer is a relatively hard etch stop material. The substrate is etched from a side opposite the back side of the substrate to provide a slot in the substrate.
REFERENCES:
patent: 5500279 (1996-03-01), Walter et al.
patent: 5960313 (1999-09-01), Jun
patent: 7052927 (2006-05-01), Fletcher et al.
patent: 2001/0013638 (2001-08-01), Lam et al.
patent: 2002/0086456 (2002-07-01), Cunningham et al.
patent: 2002/0145179 (2002-10-01), Lam et al.
patent: 2003/0207586 (2003-11-01), Lam et al.
patent: 2004/0137698 (2004-07-01), Taraschi et al.
patent: 2001-353700 (2001-12-01), None
Krawczyk John W.
McNees Andrew L.
Money Christopher J.
Patil Girish S.
Rhine David B.
Everhart Caridad
Lexmark International Inc.
Luedeka Neely & Graham PC
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