Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1988-05-27
1990-02-13
Willis, Davis L.
Optics: measuring and testing
By particle light scattering
With photocell detection
356352, G01B 902
Patent
active
049001507
ABSTRACT:
A variety of techniques for deriving cavity linewidth that share the use of multiple input sources of known frequency separation is disclosed allowing the measurement of resonator cavity linewidth. Among the techniques include a double peak ratio method for measuring cavity linewidth through use of a low pass filter. The double peak ratio method allows vertical measurements which are noise immune and independent of swept frequency errors as a method of determining cavity linewidth in a straightforward and accurate manner.
REFERENCES:
V. E. Sanders, "High-Precision Reflective Measurement Technique for Low-Loss Laser Mirrors," Applied Optics, vol. 16, p. 19, Jan. 1977.
D. Z. Anderson et al., "Mirror Reflectometer Based on Optical Cavity Decay Time," Applied Optics, vol. 23, p. 1238, Apr. 1984.
D. A. Smith et al., "Simple Measurement of Gain and Loss in Ultralow Optical Resonators," Applied Optics, vol. 24, p. 1722, Jun. 1985.
Koren Matthew W.
Litton Systems Inc.
Willis Davis L.
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