Multiple frequency laser interference microscope

Details Multiple frequency laser interference microscope Multiple frequency laser interference microscope

1983-12-06

1986-12-30

McGraw, Vincent P.

Optics: measuring and testing

By particle light scattering

With photocell detection

356351, 356361, G01B 902

Patent

active

046325549

ABSTRACT:
A multiple frequency laser interference microscope in which a source of coherent laser light containing at least two frequencies of light is used in conjunction with a transmitted light polarizing microscope so as to provide an interference microscope. Using a wide fringe mode of operation refractive index becomes directly visible as shades and hues of different colors, and discontinuities and gradients of less than 0.001 may be detected. Using a narrow fringe mode of operation, measurement of fringe shift and thickness permit exact and rapid calculation of refractive index to 0.00n at least.

REFERENCES:
patent: 2518647 (1950-08-01), Teeple et al.
patent: 3359851 (1967-12-01), Lipschutz et al.
patent: 3914057 (1975-10-01), Smith et al.
patent: 4030831 (1977-06-01), Gowrinathan
patent: 4302108 (1981-11-01), Timson

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