Multiple focal spot X-ray inspection system

X-ray or gamma ray systems or devices – Source – Electron tube

Reexamination Certificate

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Details

C378S147000

Reexamination Certificate

active

06895079

ABSTRACT:
An X-ray inspection system includes an X-ray source that generates more than one beam defining an inspection plane, the beams being substantially parallel to each other; an X-ray detector having a plurality of detector arrays, each of which is aligned with one of the beams, and structure for supporting an object between the X-ray source and the X-ray detector. The X-ray source includes an electron gun and a device for steering an electron beam generated by the gun to multiple focal spots on a target.

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