Multiple contact electrical test probe assembly

Details Multiple contact electrical test probe assembly Multiple contact electrical test probe assembly

1977-09-06

1979-12-04

Rolinec, Rudolph V.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, G01R 106, G01R 3102

Patent

active

041774256

ABSTRACT:
A multiple contact test probe assembly for testing miniature electronic circuit devices includes a non-conductive support having a plurality of spaced slots extending therethrough, all of the slots being substantially parallel and lying in a common plane. The assembly is provided with a plurality of electrically conductive contact elements, each element dimensioned to press fit within at least one of the slots and having a bend between the ends of each element to restrict sliding through the corresponding slot. At least one end of each contact element is adapted to sequentially engage a miniature electronic circuit for testing purposes, each contact element having sufficient tensile strength to withstand sequential testing of the circuit devices.

REFERENCES:
patent: 3560907 (1971-02-01), Heller
patent: 3866119 (1975-02-01), Ardezzone et al.
patent: 3996514 (1976-12-01), Brown et al.
Bove, R.; "Kelvin Probe"; IBM Tech. Dis. Bull.; vol. 13; No. 1; Jun. 1970; pp. 169-170.
Caccoma et al.; "AC Probe"; IBM Tech. Dis. Bull.; vol. 12; No. 10; Mar. 1970; p. 1667.

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