Multiple collector mass spectrometers

Details Multiple collector mass spectrometers Multiple collector mass spectrometers

1982-12-06

1985-06-18

Smith, Alfred E.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

250299, 250396ML, H01J 4930

Patent

active

045242755

ABSTRACT:
In a mass spectrometer, suitable for use in the determination of isotope ratios, having as a mass selector a sector magnet and detector means for detecting and measuring the intensity of ion beams at two or more positions in the focal plane of said sector magnet, the improvement comprises providing the exit (and optionally also the entrance) pole face of said sector magnet with a curvature such that the focal plane of said sector magnet lies substantially at right angles to the ion optical axis as it passes through said focal plane. With this arrangement, motion of detector means between positions in said focal plane by means of mechanical linkages controlled from outside the vacuum system of the mass spectrometer is facilitated.

REFERENCES:
patent: 3522428 (1970-08-01), Powers
patent: 4174479 (1979-11-01), Tuithof et al.
Harald A. Enge, "Deflecting Magnets", pp. 203-263, from Septier, A., The Focusing of Charged Particles, Academic Press, New York, 1967.
H. H. Tuithof et al, "A Magnetic Mass Spectrometer with Simultaneous Ion-Detection and Variable Mass Dispersion in Laser Pyrolysis and Collision-induced Dissociation Studies", Adv. in Mass Spectrometry, vol. 7, pp. 838-845 (Heyden, London, 1978), 1976.
H. H. Tuithof et al, "Variation of the Dispersion, Resolution and Inclination of the Focal Plane of a Single-Focussing Mass Spectrometer by Use of Two Quadrupoles", Int. J. Mass Spectrometry and Ion Physics, 1976, 20, pp. 107-121.
Isao Takeshita et al, "A Prism Mass Spectrometer with Two Q Lenses", pp. 855-857, Adv. in Mass Spectrometry, 7 (Heyden, London, 1978).
N. W. Parker et al, "Design of Magnetic Spectrometers with Second-Order Aberrations Corrected. I: Theory", pp. 333-351, 86 Optik. vol. 51, No. 4, 1978.
R. F. Egerton, "Design of an Aberration-Corrected Electron Spectrometer for the TEM", pp. 229-242, 86 Optik, vol. 57 (1980) No. 2.
Extract from PhD Thesis of H. H. Tuithof, pp. 58-64, University of Delft, Mar. 1977.
G. J. Louter et al, "A Tandem Mass Spectrometer for Collision-Induced Dissociation", Int. J. Mass Spectrom. & Ion Phys., 1980, 33, pp. 335-345.
G. J. Louter et al, "Ion Optics of a Tandem Mass Spectrometer with Variable Dispersion and Simultaneous Detection: Second Stage", pp. 137-142, Nucl. Instr. & Methods, 1981, 187.
G. J. Louter et al, "Application of Matrix Calculation. I. The Design and Adjustment of a Tandem Mass Spectrometer for Collision-Activated Dissociation (CAD)", Int. J. of Mass Spectrom. & Ion Physics, 1981, vol. 39, pp. 197-218.
T. Matsuo et al, "Application of Quadrupole Lenses to Mass Spectrometers", Adv. in Mass Spectrometry 7, Heyden, London, 1978, pp. 851-854.

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