Multiple channel electron beam optical column lithography system

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens

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Details

250398, 2504922, G21K 108, H01J 314, H01J 326

Patent

active

046941789

ABSTRACT:
The invention provides an improved direct-write/read charged particle beam lithography/readout system employing multiple channel charged particle beam optical columns wherein a plurality of individually controlled, single deflector stage charged particle beam optical columns are operated in parallel to simultaneously write or read the same or complementary semiconductor device microcircuit patterns on a plurality of different target areas of a semiconductor target wafer whereby considerably increased thru-put of a microcircuit fabrication facility is achieved.

REFERENCES:
patent: 3491236 (1970-01-01), Newberry
patent: 4151422 (1979-04-01), Goto et al.
patent: 4200794 (1980-04-01), Newberry et al.
patent: 4213053 (1980-07-01), Pfeiffer
patent: 4390789 (1983-06-01), Smith et al.
patent: 4465934 (1984-08-01), Westerberg et al.

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