Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1997-06-17
2000-01-18
Kim, Robert H.
Optics: measuring and testing
By particle light scattering
With photocell detection
356356, G01B 902
Patent
active
060161965
ABSTRACT:
A multiple beam pair optical imaging apparatus includes a multiple beam pair generator and an illuminator. The illuminator is provided for illuminating an object with a first illumination comprising an interference pattern of modulated basis vectors arising from the multiple beam pairs. A detector is provided for detecting a characteristic of a second illumination received from the object in response to the first illumination. A processor is provided in electrical communication with the detector that calculates the coefficients of interaction of the object with the modulated basis vectors in response to the characteristic of the second illumination and the pattern of the modulated basis vectors.
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Kim Robert H.
Lee Andrew H.
Massachusetts Institute of Technology
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