Multiple axis multipoint non-contact measurement system

Details Multiple axis multipoint non-contact measurement system Multiple axis multipoint non-contact measurement system

2008-09-02

2008-09-02

Epps, Georgia Y. (Department: 2878)

Radiant energy

Photocells; circuits and apparatus

With circuit for evaluating a web, strand, strip, or sheet

C250S206100, C250S559290, C250S559380, C356S003100, C356S003120, C356S602000

Reexamination Certificate

active

11364488

ABSTRACT:
Apparatus for optically measuring a remote object comprises at least one source for projecting a plurality of discrete zones of electromagnetic radiation (for example laser spots) along a projection plane. Imaging apparatus images a plurality of reflections from the remote object. By spatially offsetting the imaging apparatus from the projection plane, easier discrimination and identification of the reflections is made possible.

REFERENCES:
patent: 4687325 (1987-08-01), Corby, Jr.
patent: 4937445 (1990-06-01), Leong et al.
patent: 5056922 (1991-10-01), Cielo et al.
patent: 5109161 (1992-04-01), Horiuchi et al.
patent: 5196900 (1993-03-01), Pettersen
patent: 5811827 (1998-09-01), Pryor et al.
patent: 5986745 (1999-11-01), Hermary et al.
patent: 6204755 (2001-03-01), Kikuchi
patent: 6825936 (2004-11-01), Metcalfe et al.
patent: 6876458 (2005-04-01), Kraus
patent: 7208749 (2007-04-01), Drake, Jr.
patent: 2004/0119035 (2004-06-01), Kong et al.
patent: 2004/0246495 (2004-12-01), Abe

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