Multimode-laser interferometric apparatus for eliminating backgr

Details Multimode-laser interferometric apparatus for eliminating backgr Multimode-laser interferometric apparatus for eliminating backgr

1994-03-18

1995-09-19

Turner, Samuel A.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

G01B 902

Patent

active

054520886

ABSTRACT:
Fizeau interferometer that utilizes a multimode laser as a light source for testing transparent thin-plate samples. As a result of multimode linear laser operation, interference fringes are obtained only when the optical path difference between the reference surface and test surface is equal to twice a multiple of the laser's effective cavity length. By judicially selecting the multimode spectrum of operation and the effective cavity length of the laser, the interferometer may be calibrated to produce interference fringes at a workable separation between the reference and test surfaces without ghost interference fringes from the far surface of the thin-plate sample. Another embodiment of the invention alternatively utilizes two linear lasers with different effective cavity lengths to eliminate ghost interference fringes when the optical thickness of the thin-plate is equal to a multiple of one laser's effective cavity length.

REFERENCES:
patent: 4872755 (1989-10-01), Kuchel
patent: 4969736 (1990-11-01), Slotwinski
patent: 5323229 (1994-06-01), May et al.
patent: 5341205 (1994-08-01), McLandrich et al.
P. de Groot et al., Laser diodes map surface flatness . . . , Feb. 1994, published in Laser Focus World.
Katsuyuki OAkada et al., Separate measurements of surface shape . . . , Aug. 1990, vol. 29, No. 22, Applied Optics.
Y. Ning et al., Char. of laser diodes . . . , Sep. 1989, vol. 28, No. 17, Applied Optics.
D. Huang et al., Optical Coherence Tomography, Nov. 1991, vol. 254, Science Reports.

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