Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate
2006-05-09
2006-05-09
Owens, Douglas W (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified material other than unalloyed aluminum
C257S759000, C257S760000
Reexamination Certificate
active
07042092
ABSTRACT:
The capacitance of a multilevel metal interconnect formed on a semiconductor substrate can be adjusted, and thereby optimized, to respond to signals from devices that are formed on the underlying substrate by forming capacitive structures in trenches which have been formed using the top metal layer as a mask.
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Padmanabhan Gobi R.
Yegnashankaran Visvamohan
National Semiconductor Corporation
Owens Douglas W
Pickering Mark C.
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