Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
Reexamination Certificate
2007-07-10
2007-07-10
Evans, F. L. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With raman type light scattering
Reexamination Certificate
active
11187300
ABSTRACT:
Provided herein are dual- and multi-layer metal film over nanostructure substrates. These Dual-FON and Multi-FON SERS substrates comprise a rough nanostructured layer and two or more SERS-active metal film layers deposited thereon with a layer of dielectric between the metal film layers. Also provided is a method of increasing the intensity of a Raman signal during surface enhanced Raman spectroscopy using the SERS substrates and a method of fabricating these Dual- or Multi-FON SERS substrates.
REFERENCES:
Mulvaney et al., Three-Layer Substrates for Surface-Enhanced Raman Scattering: Preparation and Preliminary Evaluation, Jounal of Raman Spectroscopy, 2003, vol. 43, pp. 163-171.
Dick et al., Metal Film over Nanosphere (MFON) Electrodes for Surface-Enhanced Raman Spectroscopy (SERS): Improvements in Surface Nanostructure Stability and Suppression of Irreversiable Loss, J. Phys. Chem. B, 2002, vol. 106, pp. 853-860.
Cullum Brian M.
Li Honggang
Adler Benjamin Aaron
Evans F. L.
University of Maryland at Baltimore County
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