Electricity: measuring and testing – Magnetic – Magnetometers
Patent
1996-03-14
1998-11-17
Strecker, Gerard R.
Electricity: measuring and testing
Magnetic
Magnetometers
324260, G01R 3302
Patent
active
058381546
ABSTRACT:
A magnetic sensor element 1 includes a substrate 10, a conductive layer 12 of a conductive material, and a magnetic layer 11 of a magnetic material, which encloses the conductive layer 12. AC is applied to the element from a drive power source 50, and a detector 60 detects an impedance change due to an external magnetic field. The magnetic layer 11 is bestowed with magnetic anisotropy in a direction orthogonal to the direction of energization of the element 1. With the provision of the conductive layer 12 of conductive material and also with magnetic anisotropy imparted to the magnetic layer 1, the element 1 may be made a low resistivity element. A reactance change and a resistance change of the element due to an external magnetic field change, thus can be effectively detected in drive frequencies two orders of magnitude lower than in the case of a prior art magnetic sensor element. The magnetic anisotropy of the magnetic layer 11 is controlled to prevent magnetic field detection dynamic range variations with drive frequency.
REFERENCES:
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patent: 4635152 (1987-01-01), Iwasaki et al.
patent: 5365391 (1994-11-01), Sugiyama et al.
Iwasaki et al; "Film Thickness . . . Using Induced RF Permeability Change," IEEE Transactions on Magnetics, vol. MAG-23, No. 5, Sep. 1987, pp. 2506-2508.
Senda et al; "High frequency measurement technique . . . magnetic film inductance line", Rev. Sci. Instrum., 64, No. 4, Apr. 1993, pp. 1034-1037.
Morikawa Takeshi
Nishibe Yuji
Nonomura Yutaka
Sakata Jiro
Takeuchi Masaharu
Kabushiki Kaisha Toyota Chuo Kenkyusho
Strecker Gerard R.
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