Multilayered A1-alloy structure for metal conductors

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257765, 257751, 257763, 257758, H01L 2348, H01L 2352, H01L 2940

Patent

active

056419945

ABSTRACT:
A Si IC includes an Al-based layer which is deposited as a composite of sublayers of different composition Al-based materials. In one embodiment a first sublayer comprises an Al-Si-based alloy disposed so as to prevent substantial Si migration into the first sublayer, and a second sublayer, above the first, comprises an Al-based alloy with substantially no Si to alleviate precipitation-induced problems.

REFERENCES:
patent: 4673623 (1987-06-01), Gardner et al.
patent: 4910580 (1990-03-01), Kuecher et al.
patent: 5360995 (1994-11-01), Graas
patent: 5427666 (1995-06-01), Mueller et al.
patent: 5523259 (1996-06-01), Merchant et al.
patent: 5552341 (1996-09-01), Lee

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Multilayered A1-alloy structure for metal conductors does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Multilayered A1-alloy structure for metal conductors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multilayered A1-alloy structure for metal conductors will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-150649

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.