Multilayer ZnO polycrystalline diode

Active solid-state devices (e.g. – transistors – solid-state diode – Voltage variable capacitance device

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S599000, C257S653000

Reexamination Certificate

active

06316819

ABSTRACT:

BACKGROUND OF THE INVENTION
Brief Summary of the Invention
A multilayer ZnO polycrystalline diode that protects against electrostatic discharges, over-current, and voltage surges overcoming the aforementioned drawbacks is provided. The present invention further includes a polycrystalline system formed by a network of elementary ZnO diodes; each elementary ZnO diode comprises at least one ZnO grain and a balance layer of Bi
2
O
3
. The balance layer of Bi
2
O
3
is configured surrounding the at least one ZnO grain and the polycrystalline system is formed into a plurality of layers.


REFERENCES:
patent: 4165351 (1979-08-01), May
patent: 4290041 (1981-09-01), Utsumi et al.
patent: 4510112 (1985-04-01), Lauf
patent: 4527146 (1985-07-01), Kanai et al.
patent: 4729058 (1988-03-01), Gupta et al.
patent: 4811164 (1989-03-01), Ling et al.
patent: 4959262 (1990-09-01), Charles et al.
patent: 5369390 (1994-11-01), Lin et al.
patent: 0 189 987-A1 (1986-01-01), None
Dalay, U, et al., “Excess Capacitance of Zn)-Au Varactors,” Applied Physics A, 42, 2490255 (1987).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Multilayer ZnO polycrystalline diode does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Multilayer ZnO polycrystalline diode, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multilayer ZnO polycrystalline diode will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2573762

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.