Multilayer semiconductor device

Details Multilayer semiconductor device Multilayer semiconductor device

2005-10-21

2008-12-16

Karlsen, Ernest F (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

07466158

ABSTRACT:
The present invention is applied to a multilayer semiconductor device including a plurality of layered semiconductor chips. At least one of the plurality of layered semiconductor chips comprises a pad that is not connected to any external circuit terminal of the multilayer semiconductor device. The multilayer semiconductor device further comprises a separating element that connects the pad to a test stub line when each semiconductor chip is tested and separates the pad from the test stub line during the normal operation.

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