Optical: systems and elements – Light interference – Produced by coating or lamina
Reexamination Certificate
2006-03-28
2006-03-28
Nguyen, Thong (Department: 2872)
Optical: systems and elements
Light interference
Produced by coating or lamina
C359S359000, C359S586000, C359S589000, C359S588000
Reexamination Certificate
active
07019905
ABSTRACT:
A multilayer interference reflecting film has individual optical layers arranged to form optical repeat units throughout the film. Each of a plurality of optical repeat units has six individual layers, at least three of which have different refractive indices at a design wavelength λ0. Individual layers having nominally the same refractive index and physical thickness, arbitrarily labeled “A”, “B”, “C”, and “D”, are arranged in a six-layer optical repeat unit in a cyclic permutation of CACDBD, where the A and B layers are each thicker than the C and D layers. The thicknesses and refractive indices of the individual layers can be selected to suppress the second, third, and fourth order reflections, while reflecting light at the design wavelength.
REFERENCES:
patent: 0540768 (1895-06-01), Western
patent: 3124639 (1964-03-01), Kahn
patent: 3247392 (1966-04-01), Thelen
patent: 3610729 (1971-10-01), Rogers
patent: 3711176 (1973-01-01), Alfrey, Jr. et al.
patent: 3860036 (1975-01-01), Newman, Jr.
patent: 4229066 (1980-10-01), Rancourt et al.
patent: 4446305 (1984-05-01), Rogers et al.
patent: 4520189 (1985-05-01), Rogers et al.
patent: 4521588 (1985-06-01), Rogers et al.
patent: 4525413 (1985-06-01), Rogers et al.
patent: 4720426 (1988-01-01), Englert et al.
patent: 5103337 (1992-04-01), Schrenk et al.
patent: 5188760 (1993-02-01), Hikmet et al.
patent: 5211878 (1993-05-01), Reiffenrath et al.
patent: 5235443 (1993-08-01), Barnik et al.
patent: 5269995 (1993-12-01), Ramanathan et al.
patent: 5294657 (1994-03-01), Melendy et al.
patent: RE34605 (1994-05-01), Schrenk et al.
patent: 5316703 (1994-05-01), Schrenk
patent: 5319478 (1994-06-01), Fijnfschilling et al.
patent: 5360659 (1994-11-01), Arends et al.
patent: 5389324 (1995-02-01), Lewis et al.
patent: 5448404 (1995-09-01), Schrenk et al.
patent: 5486935 (1996-01-01), Kalmanash
patent: 5486949 (1996-01-01), Schrenk et al.
patent: 5612820 (1997-03-01), Schrenk et al.
patent: 5629055 (1997-05-01), Revol et al.
patent: 5686979 (1997-11-01), Weber et al.
patent: 5699188 (1997-12-01), Gilbert et al.
patent: 5721603 (1998-02-01), De Vaan et al.
patent: 5744534 (1998-04-01), Ishiharada et al.
patent: 5751388 (1998-05-01), Larson
patent: 5767935 (1998-06-01), Ueda et al.
patent: 5770306 (1998-06-01), Suzuki et al.
patent: 5783120 (1998-07-01), Ouderkirk et al.
patent: 5793456 (1998-08-01), Broer et al.
patent: 5808794 (1998-09-01), Weber et al.
patent: 5825542 (1998-10-01), Cobb, Jr. et al.
patent: 5825543 (1998-10-01), Ouderkirk et al.
patent: 5882774 (1999-03-01), Jonza et al.
patent: 5940149 (1999-08-01), Vanderwerf
patent: 5962114 (1999-10-01), Jonza et al.
patent: 5965247 (1999-10-01), Jonza et al.
patent: 6049419 (2000-04-01), Wheatley et al.
patent: 2001/0022982 (2001-09-01), Neavin et al.
patent: 2004/0145803 (2004-07-01), Eisenkramer
patent: 07-244204 (1995-09-01), None
patent: 07-244205 (1995-09-01), None
patent: 2003-302521 (2003-10-01), None
patent: WO 95/27919 (1995-04-01), None
patent: WO 95/17303 (1995-06-01), None
patent: WO 95/17691 (1995-06-01), None
patent: WO 97/01440 (1997-01-01), None
patent: WO 97/01774 (1997-01-01), None
patent: WO 99/36248 (1999-07-01), None
patent: WO 02/061469 (2002-08-01), None
3M Innovative Properties Company
Higgins Milena G.
Jensen Stephen C.
Nguyen Thong
Pritchett Joshua L.
LandOfFree
Multilayer reflector with suppression of high order reflections does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Multilayer reflector with suppression of high order reflections, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multilayer reflector with suppression of high order reflections will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3602675