Multilayer eddy current probe array for complete coverage of an

Details Multilayer eddy current probe array for complete coverage of an Multilayer eddy current probe array for complete coverage of an

1996-04-15

1997-08-19

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324232, 324262, 336200, 336206, G01N 2782, G01N 2790

Patent

active

056592485

ABSTRACT:
An eddy current surface measurement array structure for complete coverage of an underlying inspection surface without requiring mechanical scanning is disclosed. A three-dimensional array of eddy current sense elements is organized as a plurality of layers of two-dimensional sub-arrays. The sub-arrays, although in different layers, are essentially identical in configuration, and are staggered such that the sense elements of one layer provide at least partial coverage of portions of the inspection surface not covered by the sense elements of another layer. As many staggered layers are included as are necessary to ensure that no "blind spots" remain, for complete coverage of the underlying inspection surface. The sense elements are disposed in a layered flexible structure fabricated employing high density interconnect fabrication techniques or other photolithographic techniques. Static (electronic) scanning is employed, by individual layer and by row and column within each layer, to form a two-dimensional image of the inspection surface.

REFERENCES:
patent: 3441840 (1969-04-01), Randle
patent: 4460869 (1984-07-01), Buser et al.
patent: 4613817 (1986-09-01), Hoenig
patent: 4810964 (1989-03-01), Granberg et al.
patent: 4982157 (1991-01-01), Seifert
patent: 4982158 (1991-01-01), Nakata et al.
patent: 5012190 (1991-04-01), Dossel
patent: 5047719 (1991-09-01), Johnson et al.
patent: 5140264 (1992-08-01), Metala et al.
patent: 5262722 (1993-11-01), Hedengren et al.
patent: 5389876 (1995-02-01), Hedengren et al.
"Probe-Flaw Interactions with Eddy Current Array Probes", B.A. Auld, Review of Progress in Quantitative NDE 10, edited by D.O. Thompson and D.E. Chimenti (Plenum Press, NY 1991) pp. 951-955.
"Flexible Substrate Eddy Current Coil Arrays", Y.D. Krampfner et al., Review of Progress in Quantitative NDE 7, edited by D.O. Thompson and D.E. Chimenti (Plenum Press, NY 1988) pp. 471-478.
"Advanced Eddy Current Array Defect Imaging", M. Macecek, Review of Progress in Quantitative NDE 10, edited by D.O. Thompson and D.E. Chimenti (Plenum Press, NY 1991) pp. 995-1002.

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