Multifaceted probes for optical analysis

Details Multifaceted probes for optical analysis Multifaceted probes for optical analysis

1991-09-13

1993-02-09

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

250339, 356244, G01N 2135

Patent

active

051856409

ABSTRACT:
Multiple internal reflection, MIR, probes or internal reflection elements, IRE, use the principal of frustrated total internal reflection, FTIR, (also known as attenuated total reflection, ATR,) in infrared spectroscopy, spectrometers, and spectrophotometers. The probes have at least three facets at one end thereof in the form of a regular pyramid preferably at an apex angle of 45.degree.. A modulated oscillating light source is located at one focus of a reflecting ellipsoidal optical element; the other focus is located at one of the facets. Detectors are similarly located with respect to each of the other facets at the focus of reflecting ellipsoidal element with other focus located at the associaed facet. One of the detectors is responsive to a reference wavelength of light, the other to a absorption wavelength of the component of the sample being analyzed. The signals from the detectors are demodulated synchronously with the oscillating light source and their demodulated signals subtracted to produce a signal proportional to the quantity of the component in the sample. A circular probe may have any number of facets. Probes of polygonal cross section may have a number of facets equal to the number of sides of the polygon with the base edges thereof congruent with the sides of the polygon. The probe is preferably coated with a reflecting layer at both ends thereof along the sides and at the bottom opposite to the facets so that only a predetermined portion is exposed to the sample.

REFERENCES:
patent: 4835389 (1989-05-01), Doyle
patent: 5096294 (1992-03-01), Layzell et al.

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