Multidimensional sensor data analyzer

Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement

Reexamination Certificate

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Details

C702S150000, C701S010000, C342S022000

Reexamination Certificate

active

07848904

ABSTRACT:
A multidimensional sensor data analyzer that includes: discretizing values in multidimensional sensor data at index locations in value surfaces that reside in a multidimensional value space; deriving surface components resulting from the intersection of a geometric beam shape function that describing the sensor beam with the value surfaces; determining minimum-maximum index location limits for the surface components; determining surface component index points by identifying the index locations that are located within the minimum-maximum index location limits for the surface components; and generating a beam value by performing a beam function using the values at the surface component index points.

REFERENCES:
patent: 4319332 (1982-03-01), Mehnert
patent: 5964710 (1999-10-01), Ganguly et al.

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