Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2010-03-01
2010-12-07
Charioui, Mohamed (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
C702S150000, C701S010000, C342S022000
Reexamination Certificate
active
07848904
ABSTRACT:
A multidimensional sensor data analyzer that includes: discretizing values in multidimensional sensor data at index locations in value surfaces that reside in a multidimensional value space; deriving surface components resulting from the intersection of a geometric beam shape function that describing the sensor beam with the value surfaces; determining minimum-maximum index location limits for the surface components; determining surface component index points by identifying the index locations that are located within the minimum-maximum index location limits for the surface components; and generating a beam value by performing a beam function using the values at the surface component index points.
REFERENCES:
patent: 4319332 (1982-03-01), Mehnert
patent: 5964710 (1999-10-01), Ganguly et al.
Charioui Mohamed
George Mason Intellectual Properties, Inc.
Grossman David G.
Ngon Ricky
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