Multichip module and testing method thereof

Details Multichip module and testing method thereof Multichip module and testing method thereof

2005-06-21

2005-06-21

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010, C714S727000

Reexamination Certificate

active

06909303

ABSTRACT:
There are provided a plurality of semiconductor chips102and103having input/output cells106and107connected to an external terminal108of a multichip module101respectively, and test circuits104and105for the multichip module which serve to optionally set the states of the input/output cells.

REFERENCES:
patent: 5444715 (1995-08-01), Gruetzner et al.
patent: 5544174 (1996-08-01), Abend
patent: 5581176 (1996-12-01), Lee
patent: 5646422 (1997-07-01), Hashizume
patent: 6630744 (2003-10-01), Tsuda
patent: 6728915 (2004-04-01), Whetsel
patent: 05-13862 (1993-01-01), None
patent: 09-213874 (1997-08-01), None
patent: 10-82834 (1998-03-01), None

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