Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
Patent
1993-12-16
1995-08-22
Gutierrez, Diego F. F.
Thermal measuring and testing
Temperature measurement
In spaced noncontact relationship to specimen
374128, 374 9, G01J 502, G01J 552, G01N 2500
Patent
active
054433150
ABSTRACT:
A multi-zone emissivity correction system and method that may be used in a multi-zone illuminator of a RTP-AVP system. The multi-zone illuminator comprises a plurality of lamps arranged in zones. A dummy lamp is also provided for each zone. A first plurality of sensors monitor the wafer and a second plurality of sensors monitor dummy lamp radiance. For each zone, an emissivity factor is determined based on the first and second pluralities of sensors. An effective black body radiance is also determined for each zone based on a wafer radiance factor for each zone and the emissivity factors.
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Lee Yong J.
Moslehi Mehrdad M.
Donaldson Richard L.
Garner Jacqueline J.
Gutierrez Diego F. F.
Hiller William E.
Texas Instruments Incorporated
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